1.

Conference Proceedings
Conference Proceedings
1. Potential Fluctuations in High-k Based Dielectric MOS Devices
Autran, J.-L. ; Munteanu, D. ; Houssa, M.
Pub. info.: Dielectrics in emerging technologies : proceedings of the international symposium.  pp.383-392,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-1
2.

Conference Proceedings
Conference Proceedings
2. Influence of the annealing duration on the interface roughness and electrical properties of low-dose SIMOX wafers
Munteanu, D. ; Guilhalmenc, C. ; Cristoloveanu, S. ; Moriceau, H. ; Cartier, A.M. ; Aspar, B.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.131-136,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
3.

Conference Proceedings
Conference Proceedings
3. Analysis of Non-Stationary Transport and Quantum Effects in Realistic 0.1 μm Partially-Depleted SOI Technology
Munteanu, D. ; Le Carval, G. ; Fenouillet-Bcranger, C.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.199-204,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
4.

Conference Proceedings
Conference Proceedings
4. Influence of Nitrogen or Argon Anneals on the Properties of SIMOX Wafers and Devices
Cristoloveanu, S. ; Ionescu, A. ; Wetteroth, T. ; Shin, H. ; Munteanu, D. ; Gentil, P. ; Hong, S. ; Wilson, S. R.
Pub. info.: Amorphous and crystalline insulating thin films--1996 : symposium held December 2-4, 1996, Boston, Massachusetts, U.S.A..  pp.213-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 446
5.

Conference Proceedings
Conference Proceedings
5. Electrical Modeling and Simulation of Nanoscale MOS Devices With a High-Permittivity Dielectric Gate Stack
Autran, J.L. ; Munteanu, D. ; Houssa, M. ; Bescond, M. ; Garros, X. ; Leroux, C.
Pub. info.: Integration of advanced micro- and nanoelectronic devices - critical issues and solutions : symposium held April 13-16, 2004, San Francisco, California, U.S.A..  pp.177-188,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 811