1.

Conference Proceedings
Conference Proceedings
1. HIGH-RESOLUTION X-RAY DIFFRACTION MEASUREMENTS OF SiGe/Si STRUCTURES
Jordan-Sweet, J. L. ; Mooney, P. M. ; Stephenson, G. B.
Pub. info.: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.201-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 375
2.

Conference Proceedings
Conference Proceedings
2. Analysis of SiGe FET Device Structures on Silicon-on-Sapphire Substrates by X-ray Diffraction
Mooney, P. M. ; Chu, J. O. ; Ott, J. A. ; Jordan-Sweet, J. L. ; Dubbelday, W. B. ; Kavanagh, K. L. ; Lagnado, I. ; Meyerson, B. S.
Pub. info.: Epitaxy and applications of si-based heterostructures : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.55-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 533