1.

Conference Proceedings
Conference Proceedings
1. Flicker noise in nitrided high-k dielectric NMOS transistors
Min, B. ; Devireddy, S. P. ; Celik Butler, Z. ; Shanware, A. ; Green, K. ; Chambers, J. J. ; Visokay, M. V. ; Colombo, L. ; Rotondaro, A. L. P.
Pub. info.: Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA.  pp.31-40,  2005.  Bellingham, Washington.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5844
2.

Conference Proceedings
Conference Proceedings
2. Flicker noise characteristics of MOSFETs with HfO2, HfAlOx, and Al2O3/HfO2 gate dielectrics
Devireddy, S. P. ; Min, B. ; Celik-Butler, Z. ; Wang, F. ; Zlotnicka, A. ; Tseng, H. -H. ; Tobin, P. J.
Pub. info.: Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA.  pp.208-217,  2005.  Bellingham, Washington.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5844