1.

Conference Proceedings
Conference Proceedings
1. Limitations of CMOS Scaling: What's Next (Invited paper)
Dunn, J. ; Joseph, A. ; Harame, D. ; Nowak, E.J. ; Meyerson, B.S.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.27-44,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-06
2.

Conference Proceedings
Conference Proceedings
2. INVITED: SILICON-GERMANIUM PROCESS TECHNOLOGY
Subbanna, S. ; Ahlgren, D. ; Harame, D. ; Meyerson, B.S.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1406-1417,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)