1.

Conference Proceedings

Conference Proceedings
Meyer,B.K. ; Wagner,Mt. ; Dirnstorfer,I. ; Hofmann,D.M. ; Karg,F.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1467-1472,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Topf,M. ; Kriegseis,W. ; Burkhardt,W. ; Dirnstorfer,I. ; Meister,D. ; Meyer,B.K.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1323-1326,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268