1.

Conference Proceedings

Conference Proceedings
Christmann,P. ; Kreissl,J. ; Hoffmann,D.M. ; Meyer,B.K. ; Schwarz,R. ; Benz,K.W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.779-783,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings

Conference Proceedings
Ganichev,S.D. ; Yassievich,I.N. ; Prettl,W. ; Diener,J. ; Meyer,B.K. ; Benz,K.W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1079-1084,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201