1.

Conference Proceedings

Conference Proceedings
Meyer, B.K. ; Hofmann, D.F. ; Oettinger, K. ; Stadler, W. ; Efros, Al. L. ; Salk, M. ; Benz, K.W.
Pub. info.: Wide band gap semiconductors : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.209-214,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 242
2.

Conference Proceedings

Conference Proceedings
Meyer, B.K. ; Hofmann, D.M. ; Stadler, W. ; Emanuelsson, P. ; Omling, P. ; Weigel, E. ; Muller-Vogt, G. ; Wienecke, F. ; Schenk, M.
Pub. info.: Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A..  pp.185-190,  1994.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 299
3.

Conference Proceedings

Conference Proceedings
Stadler, W. ; Meyer, B.K. ; Hofmann, D.M. ; Sinerius, D. ; Benz, K.W.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.445-450,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
4.

Conference Proceedings

Conference Proceedings
Meyer, B.K. ; Christmann, P. ; Stadler, W. ; Overhof, H. ; Spaeth, J-M. ; Greulich-Weber, S. ; Stich, B.
Pub. info.: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.221-234,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-1