Meyer, B.K. ; Hofmann, D.F. ; Oettinger, K. ; Stadler, W. ; Efros, Al. L. ; Salk, M. ; Benz, K.W.
Pub. info.:
Wide band gap semiconductors : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A.. pp.209-214, 1992. Pittsburgh, Pa.. Materials Research Society
Meyer, B.K. ; Hofmann, D.M. ; Stadler, W. ; Emanuelsson, P. ; Omling, P. ; Weigel, E. ; Muller-Vogt, G. ; Wienecke, F. ; Schenk, M.
Pub. info.:
Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A.. pp.185-190, 1994. Pittsburgh, PA. Materials Research Society
Stadler, W. ; Meyer, B.K. ; Hofmann, D.M. ; Sinerius, D. ; Benz, K.W.
Pub. info.:
Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.. pp.445-450, 1991. Pittsburgh, Pa.. Materials Research Society
Meyer, B.K. ; Christmann, P. ; Stadler, W. ; Overhof, H. ; Spaeth, J-M. ; Greulich-Weber, S. ; Stich, B.
Pub. info.:
Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects. pp.221-234, 1994. Pennington, NJ. Electrochemical Society