Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

26 results

Conference Proceedings

1. Group I Elements in ZnO

Meyer, B. K. ; Volbers, N. ; Zeuner, A. ; Lautenschlager, S. ; Sann, J. ; Hoffmann, A. ; Haboeck, U.

Pub. info.:	Progress in semiconductor materials V--novel materials and electronic and optoelectronic applications : symposium held November 28-December 1, 2005, Boston, Massachusetts, U.S.A.. pp.491-496, 2006. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	891

Conference Proceedings

2. Photoluminescence Investigations on a Native Donor in ZnO

Meyer, B. K. ; Lautenschlager, S. ; Graubner, S. ; Neumann, C. ; Sann, J.

Pub. info.:	Progress in semiconductor materials V--novel materials and electronic and optoelectronic applications : symposium held November 28-December 1, 2005, Boston, Massachusetts, U.S.A.. pp.339-344, 2006. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	891

Conference Proceedings

3. *ENDOR SPECTROSCOPY ON DEEP LEVEL DEFECTS IN GaAs

Spaeth, J. -M. ; Gorger, A. ; Hofmann, D. M. ; Meyer, B. K.

Pub. info.:	Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.363-374, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	104

Conference Proceedings

4. *MICROSCOPIC IDENTIFICATION OF DEFECTS IN SEMICONDUCTORS BY ELECTRON-SPIN-RESONANCE AND RELATED TECHNIQUES

Spaeth, J> M. ; Hofmann, D. M. ; Meyer, B. K.

Pub. info.:	Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.185-194, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	46

Conference Proceedings

5. Electrically Detected Magnetic Resonance on GaAs/AlGaAs Heterostructures

Wimbauer, T. ; Hofmann, D. M. ; Meyer, B. K. ; Brandt, M. S. ; Brandl, T. ; Bayerl, M. W. ; Reinacher, N. M. ; Stutzmann, M. ; Mochizuki, Y. ; Mizuta, M.

Pub. info.:	Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.511-, 1997. Pittsburgh, Penn. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	442

Conference Proceedings

6. OPTICAL AND CYCLOTRON RESONANCE INVESTIGATIONS ON GaInP/GaAs EPITAXIAL LAYERS

Emanuelsson, P. ; Drechsler, M. ; Hofmann, D. M. ; Meyer, B. K. ; Moser, M. ; Scholz, F.

Pub. info.:	Growth, processing, and characterization of semiconductor heterostructures : Symposium held November 29-December 2, 1993, Massachusetts, U.S.A.. pp.543-, 1994. Pittsburgh. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	326

Conference Proceedings

7. ELECTRON SPIN RESONANCE INVESTIGATIONS ON POROUS SILICON

Meyer, B. K. ; Hofmann, D. M. ; Christmann, P. ; Stadler, W. ; Nikolov, A. ; Scharmann, A. ; Hofstaetter, A.

Pub. info.:	Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A.. pp.453-, 1995. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	358

Conference Proceedings

8. Quality of bulk CdTe substrates and its relation to intrinsic defects

Meyer, B. K. ; Hofmann, D. M. ; Stadler, W. ; Emanuelsson, P. ; Omling, P. ; Weigel, E. ; Muller-Vogt, G. ; Wienecke, F. ; Schenk, M.

Pub. info.:	Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.. pp.433-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	302

Conference Proceedings

9. Transition Metal Luminescence in AlN Crystals

Pressel, K. ; Heitz, R. ; Nilsson, S. ; Thurian, P. ; Hoffmann, A. ; Meyer, B. K.

Pub. info.:	Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.. pp.613-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	395

10.

Conference Proceedings

10. 2.2 eV Luminescence in GaN

Hofmann, D. M. ; Kovalev, D. ; Steude, G. ; Volm, D. ; Meyer, B. K. ; Xavier, C. ; Monteiro, T. ; Pereira, E. ; Mokov, E. N. ; Amano, H. ; Akasaki, I.

Pub. info.:	Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.. pp.619-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	395

26 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by: