1.

Conference Proceedings
Conference Proceedings
1. Impact of the back-gate bias on the low-frequency noise of partially depleted silicon-on-insulator MOSFETs
Lukyanchikova, N. R. ; Garbar, N. ; Smolanka, A. ; Simoen, E. ; Mercha, A. ; Claeys, C.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.208-214,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
2.

Conference Proceedings
Conference Proceedings
2. 1/f noise in deep-submicron CMOS technology for RF and analog applications (Invited Paper)
Mercha, A. ; Simoen, E. ; Decoutere, S. ; Claeys, C.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.193-207,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
3.

Conference Proceedings
Conference Proceedings
3. Analysis of HALO implant influence on the self-heating and self-heating enhanced impact ionization on 0.13 μm floating-body partially-depleted SOI MOSFET at low temperature
Pavanello, M.A. ; Martino, J.A. ; Simoen, E. ; Mercha, A. ; Clacys, C. ; van Meer, H. ; De Meyer, K.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.389-394,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
4.

Conference Proceedings
Conference Proceedings
4. Evidence for a 'linear kink effect' in ultra-thin gate oxide SOI MOSFETs
Mercha, A. ; Simoen, E. ; Rafi, J.-M. ; Clacys, C. ; Lukyanchikova, N. ; Petrichuk, M. ; Garbar, N.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.319-324,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
5.

Conference Proceedings
Conference Proceedings
5. What Can Low-frequency Noise Learn us About the Quality of Thin-gate Dielectrics?
Simoen, E. ; Mercha, A. ; Claeys, C.
Pub. info.: Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium.  pp.153-172,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-2
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Conference Proceedings
Conference Proceedings
6. Temperature Influence on the Generation Lifetime Determination Based on Drain Current Transients in Partially Depleted SOI nMOSFETs
Martino, J.A. ; Rafi, J.M. ; Mercha, A. ; Simoen, E. ; Claeys, C.
Pub. info.: High purity silicon VIII : proceedings of the international symposium.  pp.346-356,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-05
7.

Conference Proceedings
Conference Proceedings
7. Degradation of Deep Submicron Partially Depleted SOI CMOS iransistors tinder MEV Proton or Gamma Irradiation
Simoen, E. ; Rafi, J.M. ; Mercha, A. ; De Meyer, K. ; Claeys, C. ; Kokkoris, M. ; Kossionides, E. ; Fanourakis, G. ; Mohhaindzadeh, A.
Pub. info.: Microelectronics technology and devices : SBMICRO 2003 : proceedings of the eighteenth international symposium.  pp.18-27,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-9
8.

Conference Proceedings
Conference Proceedings
8. Noise Diagnostics for Advanced Silicon Substrates and Deep Submicron Process Modules
Simoen, E. ; Mercha, A. ; Claeys, C.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.420-439,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
9.

Conference Proceedings
Conference Proceedings
9. Floating Body/Floating Well Effects in Deep Submicron MOSFETs at Liquid Nitrogen Temperature
Simoen, E. ; Hayama, K. ; Takakura, K. ; Mercha, A. ; Claeys, C. ; Ohyama, H.
Pub. info.: Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium.  pp.455-463,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-08
10.

Conference Proceedings
Conference Proceedings
10. Technology and Architecture for Deep Submicron RF CMOS Technology (Invited)
Mercha, A. ; Decoutere, S.
Pub. info.: Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium.  pp.3-15,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-08
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Conference Proceedings
Conference Proceedings
11. Radiation damage in deep submicron partially depleted SOI CMOS
Simoen, E. ; Rafi, J.M. ; Mercha, A. ; Serra-Gallifa, X. ; van Meer, H. ; De Meyer, K. ; Claeys, C. ; Kokkoris, M. ; Kossionides, E. ; Fanourakis, G.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.437-442,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
12.

Conference Proceedings
Conference Proceedings
12. Comparison Between 0.13 μm Partially-Depleted Silicon-On-Insulator Technology with Floating Body Operation at 300 K and 90 K
Pavanello, M.A. ; Martino, J.A. ; Mercha, A. ; Rafi, J.M. ; Simoen, E. ; Claeys, C. ; van Meer, H. ; De Meyer, K.
Pub. info.: Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium.  pp.205-212,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-8
13.

Conference Proceedings
Conference Proceedings
13. A Study on the Self-Heating Effect in Deep-Submicrometer Partially Depleted SOI MOSFETs at Low Temperatures
Pavanello, M.A. ; Martino, J.A. ; Simoen, E. ; Mercha, A. ; Claeys, C. ; Dc Meyer, K.
Pub. info.: Microelectronics technology and devices : SBMICRO 2003 : proceedings of the eighteenth international symposium.  pp.112-119,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-9
14.

Conference Proceedings
Conference Proceedings
14. Conduction and Low-Frequency Noise: Diagnostic Tools for Low-Temperature (<600℃) Polysilicon Thin Film Transistor Technology
Pichon, L. ; Mercha, A. ; Bonnaud, O. ; Carin, R.
Pub. info.: Thin Film Transistor Technologies VI : proceedings of the international symposium.  pp.246-256,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-23
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Conference Proceedings
Conference Proceedings
15. Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs
Simoen, E. ; Mercha, A. ; Claeys, C.
Pub. info.: Advanced experimental methods for noise research in nanoscale electronic devices.  pp.121-128,  2004.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 151
16.

Conference Proceedings
Conference Proceedings
16. Noise and Tunneling Through the 2.5 nm Gate Oxide in SOI MOSFETs
Lukyanchikova, N. ; Simoen, E. ; Mercha, A. ; Claeys, C.
Pub. info.: Advanced experimental methods for noise research in nanoscale electronic devices.  pp.129-136,  2004.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 151
17.

Conference Proceedings
Conference Proceedings
17. Noise Diagnostics of Advanced Silicon Substrates and Deep Submicron Process Modules
Simoen, E. ; Mercha, A. ; Claeys, C.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.420-439,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3
18.

Conference Proceedings
Conference Proceedings
18. Impact of line width roughness on device performance [6152-32]
Lorusso, G. F. ; Leunissen, L. H. A. ; Gustin, C. ; Mercha, A. ; Jurczak, M. ; Marchman, H. M. ; Azordegan, A.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61520W-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152