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Proceedings of SPIE - the International Society for Optical Engineering
Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China. pp.460-468, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electrically based microstructural characterization III : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.. pp.167-172, 2002. Warrendale, PA. Materials Research Society