Advances in process overlay: ATHENA alignment system performance on critical process layers
- Author(s):
- Laidler, D. ( IMEC (Belgium) )
- Megens, H.J. ( ASML (Netherlands) )
- Lalbahadoersing, S.
- van Haren, R.J.
- Bornebroek, F.
- Publication title:
- Metrology, Inspection, and Process Control for Microlithography XVI
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4689
- Pub. Year:
- 2002
- Vol.:
- Part One
- Page(from):
- 397
- Page(to):
- 408
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444356 [0819444359]
- Language:
- English
- Call no.:
- P63600/4689
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Advances in process overlay: alignment solutions for future technology nodes
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Overlay-performance on tungsten CMP layers using the ATHENA alignment system
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
10
Conference Proceedings
Extended ATHENA alignment performance and application for the 100-nm technology node
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
Integration of new alignment mark designs in dual inlaid-copper interconnect processes
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Segmented alignment mark optimization and signal strength enhancement for deep trench process
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Improved wafer stepper alignment performance using an enhanced phase grating alignment system
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |