1.

Conference Proceedings
Conference Proceedings
1. Defect Distribution Across 6-Inch CZ-Silicon Wafers
Puff,W. ; Mascher,P. ; Hahn,S. ; Cho,K.H. ; Lee,B.Y.
Pub. info.: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.2  pp.1185-1188,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 105-110
2.

Conference Proceedings
Conference Proceedings
2. Gas and heat treatment effects on the defect structure of a-SiC:H films
Friessnegg,T. ; Boudreau,M. ; Mascher,P. ; Simpson,P.J. ; Puff,W.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.709-714,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Defect distribution in large CZ-silicon wafers investigated by positron annihilation spectroscopy
Mascher,P. ; Puff,W. ; Hahn,S. ; Cho,K.H. ; Lee,B.Y.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.413-418,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
4.

Conference Proceedings
Conference Proceedings
4. Deformation-Induced Defects in GaSb
Mahony,J. ; Tessaro,G. ; Mascher,P. ; Siethoff,H. ; Brion,H.G.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1449-1454,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings
Conference Proceedings
5. Shallow Positron Traps in Gallium Arsenide
Dannefaer,S. ; Mascher,P. ; Kerr,D.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.893-898,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
6.

Conference Proceedings
Conference Proceedings
6. Vacancy-type defects in proton-irradiated SiC
Puff,W. ; Mascher,P. ; Balogh,A.G. ; Baumam,H.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.733-738,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
7.

Conference Proceedings
Conference Proceedings
7. Vacancy-type defects in eloctron and proten irradiated II-VI compounds
Brunner,S. ; Puff,W. ; Mascher,P. ; Balogh,A.G. ; Baumann,H.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1419-1424,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
8.

Conference Proceedings
Conference Proceedings
8. Vacancy Type Defects in Proton Irradiated SiC
Puff,W. ; Balogh,A.G. ; Mascher,P. ; Baumann,H.
Pub. info.: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.285-288,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 248-249
9.

Conference Proceedings
Conference Proceedings
9. Effects of Boron Doping on the Annealing Characteristics of Cz-Silicon
Puff,W. ; Mascher,P. ; Kerr,D. ; Dannefaer,S.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.225-230,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
10.

Conference Proceedings
Conference Proceedings
10. The Influence of the Zinc Concentration on the Defect Characteristics of InP
Mahony,J. ; Mascher,P.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1661-1666,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
11.

Conference Proceedings
Conference Proceedings
11. Point Defects in ZnO:Mn and Their Relation to Luminescence Centres
Mascher,P. ; Liu,M. ; Kltai,A.H. ; Puff,W.
Pub. info.: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.2  pp.1145-1148,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 105-110
12.

Conference Proceedings
Conference Proceedings
12. Hydrogen and Nitrogen Loss during ERD Analysis of Silicon(Oxy)nitrides
Wallace,S.G. ; Kockelkoren,A.C. ; Boudreau,M.G. ; Mascher,P. ; Forster,J.S. ; Davies,J.A.
Pub. info.: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.381-384,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 248-249
13.

Conference Proceedings
Conference Proceedings
13. Studies of Defects in Electron and Proton Irradiated ZnO by Positron Annihilation
Puff,W. ; Brunner,S. ; Mascher,P. ; Balogh,A.G.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.333-337,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
14.

Conference Proceedings
Conference Proceedings
14. Defect characterization of II-VI compownd semiconductors using positron lifetime spectroscopy
Tessaro,G. ; Mascher,P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1335-1340,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
15.

Conference Proceedings
Conference Proceedings
15. Positron Annihilation in Electron Irradiated Silicon
Mascher,P. ; Dannefaer,S. ; Kerr,D.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part3  pp.1157-1162,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
16.

Conference Proceedings
Conference Proceedings
16. A Positron Annihilation Study of Defects in ZnO and Their Relation to Luminescence Centers
Zhong,J. ; Mascher,P. ; Puff,W. ; Kitai,A.H.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.465-469,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
17.

Conference Proceedings
Conference Proceedings
17. Vacaucy-Type Defects in Electron and Proton Irradiated ZnS and ZnTe
Brunner,S. ; Puff,W. ; Mascher,P. ; Balogh,A.G. ; Baumann,H.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.503-505,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257
18.

Conference Proceedings
Conference Proceedings
18. Depth Profiling of Defects In Low Temperature MBE-Grown Silicon
Jackrnan,T.E. ; Aers,C.C. ; McCailrey,J.P. ; Britton,D. ; Willutzkl,P. ; Schultz,P.J. ; Simpson,P.J. ; Mascher,P.
Pub. info.: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.1  pp.301-308,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 105-110