1.

Conference Proceedings
Conference Proceedings
1. Analysis of the Linear Kink Effect in Partially Depleted SOI NMOSFETs
Agopian, P. G. ; Martino, J. A. ; Simoen, E. ; Claeys, C.
Pub. info.: Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium.  pp.512-519,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-08
2.

Conference Proceedings
Conference Proceedings
2. Temperature and Oxide Thickness Influence on the Generation Lifetime Determination in Partially Depleted SOI NMOSFETs
Galeti, M. ; Martino, J. A. ; Simoen, E. ; Claeys, C.
Pub. info.: Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium.  pp.538-547,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-08
3.

Conference Proceedings
Conference Proceedings
3. Comparison between Bulk and Floating Body Partially Depleted SOI NMOSFETs for High Frequency Analog Applications Operating from 300 K down to 95 K
Pavanello, M. A. ; Martino, J. A. ; Simoen, E. ; Claeys, C.
Pub. info.: Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium.  pp.464-471,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-08
4.

Conference Proceedings
Conference Proceedings
4. Evaluation of the Channel Engineering Impact on the Analog Performance of Deep-Submicrometer Partially Depleted SOI MOSFETs at Low Temperatures
Pavanello, M. A. ; Martino, J. A. ; Simoen, E. ; Claeys, C.
Pub. info.: Microelectronics technology and devices : SBMICRO 2004 : proceedings of the nineteenth international symposium.  pp.21-26,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-03