Portella-Oberli, M.T., Ciulin, V., Ganiere, J.-D., Deveaud, B., Kossacki, P., Kutrowski, M., Wojtowicz, T.
Kluwer Academic Publishers
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Stanley P. R., Houdre R., Oesterle U., Pellandini P., Ilegems M.
Kluwer Academic Publishers
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Deveaud Benoit
Kluwer Academic Publishers
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Gigli, G., Anni, M., Patane, S., Barbarella, G., Favaretto, L., Cingolani, R.
Materials Research Society
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Vinogradov,E.A., Farztdinov,V.M., Dobryakov,A.L., Kovalenko,S.A., Lozovik,Yu.E., Matveets,Yu.A.
SPIE - The International Society for Optical Engineering
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Leherte, L., Vercauteren, D. P., Derouane, E. G., Lie, G. C., Clementi, E., Andre, J. -M.
Elsevier
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Daran P. J., Bradley L. A., Roycroft B., Aherne T., Hegarty J., Stanley P. R., Houdre R., Oesterle U., Ilegems M.
Kluwer Academic Publishers
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Poutous, M.K., Himel, M.D., Delaney, W.F., Stack, J.D., Kathman, A.D., Fedor, A.S., Hutchins, R.E., Leonard, J.L.
SPIE-The International Society for Optical Engineering
|
Roycroft,B.J., Aherne,T.P., Hegarty,J., Moerman,I., Daele,P.Van, Baets,R.G.
SPIE - The International Society for Optical Engineering
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Reuter,D.C., Jennings,D.E., McCabe,G.H., Travis,J.W., Bly,V.T., La,A.T., Nguyen,T.L., Jhabvala,M.D., Shu,P.K., …
SPIE-The International Society for Optical Engineering
|
Barnes,M.D., Lermer,N., Kung,C., Whitten,W.B., Ramsey,J.M.
SPIE-The International Society for Optical Engineering
|
Gibbs,H.M., Ell,C., Khitrova,G., Wick,D.V., Berger,J.D., Nelson,T.R.,Jr., Kira,M., Jahnke,F., Koch,S.W.
SPIE-The International Society for Optical Engineering
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