1.

Conference Proceedings
Conference Proceedings
1. Micro-Raman Characterization of Microdefects in Bulk SiC
Martin, E. ; Chafai, M. ; Jimenez, J.
Pub. info.: Power semiconductor materials and devices : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A..  pp.241-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 483
2.

Conference Proceedings
Conference Proceedings
2. MicroRaman and Hall Effect Study of It-Type Bulk 4H-SiC
Chafai, M. ; Jimenez, J. ; Martin, E. ; Mitchel, W. C. ; Saxler, A. ; Perrin, R.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.707-710,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)