A New Technique to Profile Hot-Carrier Induced Interface State Generation in nMOSFETs using Charge Pumping

A New Technique to Profile Hot-Carrier Induced Interface State Generation in nMOSFETs using Charge Pumping

Author(s):

Publication title:

Physics of - Semiconductor Devices -

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3316

Pub. Year:

1998

Vol.:

Part 2

Page(from):

1030

Page(to):

1033

Pub. info.:

New Delhi: Narosa Publishing House

ISSN:

0277786X

ISBN:

9780819427564 [081942756X]

Language:

English

Call no.:

P63600/3316

Type:

Conference Proceedings

Details

TDL ID:	ZA00016921
Series ID:	PA00000029
Conf. info. (Name):	International Workshop on the Physics of Semiconductor Devices - IWDPSD
Conf. info. (Number):	1997 : 9th
Conf. info. (Venue):	Delhi, India
Conf. info. (Date):	1997.12.16-1997.12.20

Similar Items:

1 Conference Proceedings Device Simulation for Radiation and Hot Carrier Effects Sharma,D.K., Ekbote,S., Zaman,P, Shaila Subbaraman, Das,A., Vasi,J. Narosa Publishing House	7 Conference Proceedings THE INVESTIGATION OF FLUORINE EFFECTS ON CHARGE TRAPPING AND INTERFACE STATE GENERATION IN MOS STRUCTURES Xie, D.D., Lin, T.-C., Young, D.R. Materials Research Society
2 Conference Proceedings Hot-Carrier Defect Length Propagation in LDD NMOSFETs Raychaudhuri, A., Kwan, W.S., Deen, M.J., King, M.I.H. Electrochemical Society	8 Conference Proceedings Plasma Charging Damages for Gate Oxide and Hot-Carrier Degradation and Electro-migration Properties in Cu Interconnects So, D.S., Wang, J.J., Yang, C.T., Chen, D.H, Theng, H.C., Chen, H., Lee, S.Y. Electrochemical Society
3 Conference Proceedings HOTMOS : A 2-D MOS Device Simulator for Hot Carrier Effects Shaila Subbaraman, Sharma,D.K., Vasi,J., Das,A. Narosa Publishing House	9 Conference Proceedings Measurement of carrier transport and dynamics in wide bandgap semiconductors using femtosecond pump-probe techniques Wraback,M., Shen,H., Wood,M.C., Carrano,J.C., Collins,C.J., Li,T., Campbell,J.C., Eiting,C.J., Lambert,D.J.H., … SPIE-The International Society for Optical Engineering
4 Conference Proceedings Characterization of the carrier dynamics and interface-state charge fluctuations in quaternary AlInGaN multiple quantum well heterostructures C. Ke, C. Hung, D. Kuo, W. Chen, H. Shen, Y. Wu, J. Wang, T. Nee SPIE - The International Society of Optical Engineering	10 Conference Proceedings Development of the IBIC(ion-beam-induced charge)technique for IC failure-analysis Osipowicz,T., Sanchez,J.L., Watt,F., Kolachina,S., Ong,V.K.S., Chan,D.S.H., Phang,J.C.H. SPIE-The International Society for Optical Engineering
5 Conference Proceedings Interface Characterization of CeO2-Gated MOSFETs Using Gated Diode Method and Charge Pumping Technique F. Chiu, H. Chen, C. Chen, C. Liu, S. Chen Electrochemical Society	11 Conference Proceedings Extraction of the Slow Oxide Trap Concentration Profiles in MOS Transistors Using the Charge Pumping Technique Maneglia, Y., Bauza, D., Ghibaudo, G. Electrochemical Society
6 Conference Proceedings Using a CD-like microfluidic platform for uniform calcium alginate drug carrier generation M.-K. Liu, K.-S. Huang, J.-Y. Chang, C.-H. Wu, Y.-C. Lin SPIE - The International Society of Optical Engineering	12 Conference Proceedings An overview about the use of electrical doping of charge carrier transport layers in OLEDs and further organic electronic applications S. Madasamy, D. Pavicic, C. Rothe, S. Murano, J. Birnstock Society of Photo-optical Instrumentation Engineers

1

2

3

4

5

6

7

8

9

10

11

12