Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.545-549, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.207-210, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering