Wang, Y. ; Wang, B. ; Liu, Z. ; Luo, X. ; Chen, H.
Pub. info.:
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.283-286, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chen, H. ; Wang, B. ; Luo, X. ; Liu, Z. ; Ding, J. ; Zhu, J.
Pub. info.:
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China. pp.528-531, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chen, J. ; Xie, D. ; Chen, H. ; Xie, L. ; Song, J. ; Luo, X.
Pub. info.:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.61502D-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, R. ; Wang, B. ; Wang, J. ; Chen, H. ; Luo, X.
Pub. info.:
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.63583X-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering