Spectroscopic Studies of Superconductors Part A : Infrared and Raman Spectra : 29 January - 1 February 1996, San Jose, California. PartA pp.248-252, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.719-724, 1995. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1589-1594, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1197-1202, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1131-1136, 1997. Zurich, Switzerland. Trans Tech Publications