1.

Conference Proceedings

Conference Proceedings
Heitz,R. ; Thurian,P. ; Loa,I. ; Eckey,L. ; Hoffmann,A. ; Broser,I. ; Pressel,K. ; Meyer,B.K. ; Mokhov,E.N.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.719-724,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings

Conference Proceedings
Siegie,H. ; Kaschner,A. ; Loa,I. ; Thurian,P. ; Hoffmann,A. ; Broser,I. ; Thomsen,C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1197-1202,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings

Conference Proceedings
Thurian,P. ; Loa,I. ; Maxim,P. ; Pressel,K. ; Hoffmann,A. ; Thomsen,C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1131-1136,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263