1.

Conference Proceedings
Conference Proceedings
1. Raman scattering from defects in GaN
Siegie,H. ; Kaschner,A. ; Loa,I. ; Thurian,P. ; Hoffmann,A. ; Broser,I. ; Thomsen,C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1197-1202,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Zeeman study of the 0.94 eV emission in AlN and GaN
Thurian,P. ; Loa,I. ; Maxim,P. ; Pressel,K. ; Hoffmann,A. ; Thomsen,C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1131-1136,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263