MOSFFET Based 'Gated-Diode' Characterization of the Buried Oxide Interface of Irradiated and non-Irradiated SIMOX and UNIBOND Wafers
- Author(s):
- Publication title:
- Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 2001-3
- Pub. Year:
- 2001
- Page(from):
- 91
- Page(to):
- 96
- Pages:
- 6
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773096 [1566773091]
- Language:
- English
- Call no.:
- E23400/2001-3
- Type:
- Conference Proceedings
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