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Calculation of extended bidirectional reflectance distribution function for subsurface defect scattering [6150-184]

Author(s):
Shen, J. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) )
Liu, S ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) )
Kong, W ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) )
Shen, Z ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) )
Shao, J ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) )
Fan, Z ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) )
1 more
Publication title:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6150
Pub. Year:
2006
Pt.:
2
Page(from):
615035
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461896 [081946189X]
Language:
English
Call no.:
P63600/6150
Type:
Conference Proceedings

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