Probe imaging vision coordinate measuring system using single camera

Author(s):

• Zhang,Z. ( Harbin Institute of Technology (China) )
• Huang,Q. ( Harbin Institute of Technology (China) )
• Lin,W. ( Harbin Institute of Technology (China) )
• Che,R. ( Harbin Institute of Technology (China) )

Publication title:

Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3558

Pub. Year:

1998

Page(from):

168

Page(to):

174

Pub. info.:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819430199 [0819430196]

Language:

English

Call no.:

P63600/3558

Type:

Conference Proceedings