1.

Conference Proceedings

Conference Proceedings
Li,P. ; Mu,X.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.251-253,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
2.

Conference Proceedings

Conference Proceedings
Li,P. ; Mu,X.
Pub. info.: Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China.  pp.398-402,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3561
3.

Conference Proceedings

Conference Proceedings
Li,P. ; Mu,X.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.554-560,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558