1.

Conference Proceedings
Conference Proceedings
1. Optical heterodyne surface profiling interferometer with automatic focusing (Invited Paper)
Zhao,H. ; Liang,R. ; Wu,Y. ; Li,D. ; Cao,M.
Pub. info.: Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore.  pp.100-104,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3185
2.

Conference Proceedings
Conference Proceedings
2. CCD probe: application of linear array CCD in large-dimension measurement
Hao,Q. ; Cao,M. ; Zhao,Y. ; Li,D.
Pub. info.: Videometrics V : 30-31 July 1997, San Diego, California.  pp.330-334,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3174
3.

Conference Proceedings
Conference Proceedings
3. Measuring coaxiality and perpendicularity of the axis to an end plane using an optical method
Hao,Q. ; Zhao,Y. ; Li,D. ; Cao,M.
Pub. info.: Videometrics V : 30-31 July 1997, San Diego, California.  pp.317-320,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3174
4.

Conference Proceedings
Conference Proceedings
4. A New Method of High Accuracy Dynamic Positioning Using Diode Lasers,
Han,J. ; Li,D. ; Zhao,Y. ; Cao,M. ; Wang,J.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part1  pp.509-510,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
5.

Conference Proceedings
Conference Proceedings
5. Application of laser diode fiber alignment in measuring large-scale perpendicularity and parallelism
Hao,Q. ; Liang,R. ; Cao,M. ; Li,D.
Pub. info.: Automated optical inspection for industry : 6-7 November 1996, Beijing, China.  pp.2-5,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2899
6.

Conference Proceedings
Conference Proceedings
6. Practical heterodyne surface profiling interferometer with automatic focusing
Zhao,H. ; Liang,R. ; Li,D. ; Cao,M.
Pub. info.: Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China.  pp.301-306,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4231
7.

Conference Proceedings
Conference Proceedings
7. In-process laser diode heterodyne profilometer with moving-coil objective lens
Wu,Y. ; Li,D. ; Cao,M. ; Lu,Y.
Pub. info.: Laser interferometry VIII : applications : 8-9 August, 1996, Denver Colorado.  pp.264-268,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2861
8.

Conference Proceedings
Conference Proceedings
8. Instrument for measuring flatness by using laser and CCD
Hao,Q. ; Cao,M. ; Li,D.
Pub. info.: Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado.  pp.183-186,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2862