1.

Conference Proceedings
Conference Proceedings
1. Research on control scheme in high-density multiwavelength optical disc mastering
Li, Y. ; Li, Q. ; Zhao, D. ; Li, S. ; Jiang, P.
Pub. info.: Optical data storage 2004 : 18-21 April 2004, Monterey, California, USA.  pp.627-633,  2004.  Bellingham.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5380
2.

Conference Proceedings
Conference Proceedings
2. Detection of fruit quality based on bioimpedance using probe electrodes [5994-40]
Li, Q. ; Wang, J. ; Ye, Z. ; Ying, Y. ; Li, Y.
Pub. info.: Chemical and biological sensors for industrial and environmental security : 24-26 October, 2005, Boston, Massachusetts, USA.  pp.59940W-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5994
3.

Conference Proceedings
Conference Proceedings
3. A higher-order-statistics-based approach to face detection
Li, C. ; Li, Y. ; Wu, R. ; Li, Q. ; Zhuang, Q. ; Zhang, Z.
Pub. info.: Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China.  pp.241-248,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5637
4.

Conference Proceedings
Conference Proceedings
4. Study on lateral dual-element electron tunneling accelerometer
Li, Y. ; Li, Q. ; Long, Z. ; Zi, Y. ; Zhao, D. ; Guo, Y.
Pub. info.: Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China.  pp.23-28,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5253
5.

Conference Proceedings
Conference Proceedings
5. Development of user-friendly software for the roughness measurement of ultrasmooth surface [6150-34]
Li, H. ; Li, Y. ; Li, Q. ; Liao, X. ; Zheng, J.
Pub. info.: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  pp.61502I-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6150