1.

Conference Proceedings
Conference Proceedings
1. Annealing behavior of vanadium oxide films prepared by modified ion-beam-enhanced deposition
Li, J. ; Yuan, N. ; Xie, J.
Pub. info.: Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA.  pp.140-145,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5564
2.

Conference Proceedings
Conference Proceedings
2. Formation mechanism of the V02 polycrystalline film prepared by modified ion-beam-enhanced deposition
Li, J. ; Yuan, N.
Pub. info.: Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China.  pp.232-236,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5774
3.

Conference Proceedings
Conference Proceedings
3. Properties of PT/P(VDF-TrFE) pyroelectric sensor based on porous SiO2 substrate
Li, J. ; Yuan, N. ; Chan, H.L.W. ; Choy, C.L.
Pub. info.: Advanced photonic sensors and applications II : 27-30 November 2001, Singapore.  pp.22-28,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4596
4.

Conference Proceedings
Conference Proceedings
4. Switching property of sol-gel vanadium oxide thin films
Yuan, N. ; Li, J. ; Lin, C.
Pub. info.: Advanced photonic sensors and applications II : 27-30 November 2001, Singapore.  pp.16-21,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4596
5.

Conference Proceedings
Conference Proceedings
5. Improve the charge stability of SiO2 films by plasma treatment and ion implantation
Yuan, N. ; Li, J.
Pub. info.: Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China.  pp.78-81,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5774
6.

Conference Proceedings
Conference Proceedings
6. Influence of Ta doping on the phase transition characteristics of VO2 polycrystalline thin films [6149-11]
Li, J. ; Yuan, N. ; Xie, T. ; Dan, D.
Pub. info.: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies.  pp.61490B-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6149