1.

Conference Proceedings

Conference Proceedings
Zheng, L. ; Zhang, Q. ; Lei, Y. ; Li, H.
Pub. info.: Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA.  pp.58840H-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5884
2.

Conference Proceedings

Conference Proceedings
Lei, Y. ; Shu, Y. ; Zheng, L. ; Li, H.
Pub. info.: Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA.  pp.58840G-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5884
3.

Conference Proceedings

Conference Proceedings
Li, H. ; Gao, H. ; Feng, X. ; Wang, X.
Pub. info.: Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA.  pp.58840L-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5884
4.

Conference Proceedings

Conference Proceedings
Wang, X. ; Li, H. ; Gao, H. ; Du, B. ; Li, W.
Pub. info.: Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA.  pp.58840K-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5884
5.

Conference Proceedings

Conference Proceedings
Li, H. ; Torrance, K. E.
Pub. info.: Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA.  pp.58780V-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5878
6.

Conference Proceedings

Conference Proceedings
Li, H. ; Peng, H. ; Li, X. ; Veroustraete, F.
Pub. info.: Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium.  pp.59831W-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5983
7.

Conference Proceedings

Conference Proceedings
Li, H. ; Peng, H. ; Li, X. ; Veroustraete, F. ; Chen, Y.
Pub. info.: Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium.  pp.59831V-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5983
8.

Conference Proceedings

Conference Proceedings
Lv, Y. ; Tian, J. ; Li, H. ; Luo, J. ; Cong, W. ; Wang, G. ; Kumar, D.
Pub. info.: Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA.  pp.63180I-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6318
9.

Conference Proceedings

Conference Proceedings
Yang, W.H. ; Li, Y.B. ; Wu, L. ; Yang, A.P. ; Li, J.D. ; Li, H.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.894-897,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
10.

Conference Proceedings

Conference Proceedings
Zhang, Z. ; Li, H. ; Zhou, H. ; Li, L. ; Liu, X.
Pub. info.: ICO20 : MEMS, MOEMS, and NEMS : 21-26 August, 2005, Changchun, China.  pp.603209-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6032