Blank Cover Image

Microdefects in Nitrogen Doped FZ Silicon Revealed by Li+ Drifting

Author(s):
Knowlton,W.B.
Walton,J.T.
Lee,J.S.
Wong,Y.K.
Haller,E.E.
Ammon,W.v.
Zulehner,W.
2 more
Publication title:
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
Title of ser.:
Materials science forum
Ser. no.:
196-201
Pub. Year:
1995
Pt.:
4
Page(from):
1761
Page(to):
1766
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497164 [0878497161]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Lithium-Ion Drifting: Application to the Study of Point Defects in Floating-Zone Silicon

Walton,J.T., Haller,E.E., Knowlton,W.B., Wong,Y.K., Ammon,W.V., Zulehner,W.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings IMPACT OF NITROGEN DOPING IN SILICON ONTO GATE OXIDE INTEGRITY

Huber, A., Kapser, M., Grabmeier, J., Lambert, U., Ammon, W.v., Pech, R.

Electrochemical Society
2 Conference Proceedings Properties of Silicon Point Defects as Revealed by Lithium Ion Drifting

Knowlton, W.B., Walton, J.T., Lee, J.S., Lewak, D., Wong, Y.K., Haller, E.E.

Electrochemical Society
8 Conference Proceedings The Dependence of Ring Like Distributed Stacking Faults on the Axial Temperaure Gradient of of Growing Czochralski Silicon Crystals

Domberger, E., Ammon, W.v.

Electrochemical Society
3 Conference Proceedings Lithium-Ion Drifting: Application to the Study of Point Defects in Floating-Zone Silicon

Walton, J.T., Haller, B.E., Knowlton, W.B., Wong, Y.K., Ammon, W.V., Zuichner, W.

Electrochemical Society
9 Conference Proceedings IMPACT OF NITROGEN DOPING IN SILICON ONTO GATE OXIDE INTEGRITY

Huber, A., Kapser, M., Grabmeier, J., Lambert, U., von Ammon, W., Pech, R.

Electrochemical Society
4 Conference Proceedings Past, Present and Future Cosmic Ray Identification Applications for Large Area Silicon Detectors

Walton, J.T., Lee, J.S., Lewak, D., Wong, Y.K., Cummings, A.C., Mewaidt, R.A., Wiedenbeck, M.E., Knowlton, W.B., Haller, …

Electrochemical Society
10 Conference Proceedings DEFECT BEHAVIOUR OF OXYGEN DOPED FZ CRYSTALS

Ammon, W.v., Ehlert, A., Hensel, W.

Electrochemical Society
5 Conference Proceedings High Silicon Self-Interstitial Diffusivity as Revealed by Lithium Ion Drifting

Knowlton, W. B., Walton, J. T., Wong, Y. K., Mason, I. A., Haller, E. E.

MRS - Materials Research Society
11 Conference Proceedings Preliminary test results of a resonant Ge:Ga far-infrared photoconductor

Farhoomand,J., Knowlton,B., McMurray,R.E.,Jr., Haller,E.E.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Formation and Control of Defects in Nitrogen Doped Silicon Crystals （Invited Paper）

Huber, A., Lambert, U., Hackl, W., Ammon, W.v.

Electrochemical Society
12 Conference Proceedings GATE OXIDE RELATED BULK PROPERTIES OF OXYGEN DOPED FLOATING ZONE AND CZOCHRALSKI SILICON

Ammon, W.v., Ehlert, A., Lambert, U., Graef, D., Brohl, M., Wagner, P.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12