Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.514-517, 2006. Uetikon-Zuerich. Trans Tech Publications
Lee, H.J. ; Lee, N.K. ; Lee, S.M. ; Lee, G.A. ; Kim, S.S.
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Progress on advanced manufacture for micro/nano technology 2005 : proceedings of the 2005 International Conference on Advanced Manufacture Taipei, Taiwan, R.O.C. November 28th-December 2nd, 2005. pp.19-24, 2006. Uetikon-Zuerich. Trans Tech Publications
Ku, J.N. ; Yoon, E.Y. ; Won, J.H. ; Song, I.J. ; Chang, D.H. ; Hwang, S.M. ; Park, M.K. ; Bang, D.S. ; Um, M.S. ; Park, S.M. ; Lee, S.M. ; Jang, D.H.
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Optical components and transmission systems : APOC 2002 : Asia-Pacific Optical and Wireless Communications : 16-18 October, 2002, Shanghai, China. pp.107-115, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Yoon, S.G. ; Park, S.J. ; Lim, J.Y. ; Kim, M.S. ; Cho, B.H. ; Lee, S.M. ; Kim, S.J.
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Smart structures and materials 2004 : electroactive polymer actuators and devices (EAPAD) : 15-18 March 2004, San Diego, California, USA. pp.500-507, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
New trends in intercalation compounds for energy storage and conversion : proceedings of the international symposium. pp.213-220, 2003. Pennington, N.J.. Electrochemical Society
Semiconductor photodetectors II : 25-26 January 2005, San Jose, California, USA. pp.1-9, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advances in laboratory-based X-ray sources and optics III : 8 July, 2002, Seattle, Washington, USA. pp.77-86, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Lee, S.M. ; Fleury, E. ; Kim, J.S. ; Kim, Y.C. ; Kim, D.H. ; Kim, W.T. ; Ahn, H.S.
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Quasicrystals-preparation, properties and applications : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, Pa.. Materials Research Society
Quasicrystals-preparation, properties and applications : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, Pa.. Materials Research Society
Lee, S.M. ; Shur, J.W. ; Shin, T.I. ; Yang, W.S. ; Kim, G.Y. ; Baek, S.W. ; Yoon, D.H.
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Designing, processing and properties of advanced engineering materials : proceedings of the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials, held in Jeju, Korea, November 5-8, 2003. pp.985-988, 2004. Zuerich. Trans Tech Publications
Proceedings of the symposium on recent advances in the chemistry and physics of fullerenes and related materials. pp.1044-1056, 1994. Pennington, NJ. Electrochemical Society
Superplasticity in advanced materials, ICSAM-2000 : proceedings of the 2000 International Conference on Superplasticity in Advanced Materials (ICSAM-2000) held at Sheraton International Resort, Orlando [Florida], USA during August 1-4, 2000. pp.321-326, 2001. Uetikon-Zuerich, Switzerland. Trans Tech Publications
ANTEC 2004, 62nd annual technical conference, Chicago, IL, May 16-20, 2004. pp.3414-3417, 2004. Brookfield Center, Conn.. Society of Plastics Engineers
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Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
ANTEC 2004, 62nd annual technical conference, Chicago, IL, May 16-20, 2004. pp.3410-3413, 2004. Brookfield Center, Conn.. Society of Plastics Engineers
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Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII. pp.65-72, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.940-948, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering