Scatterometry based CD and profile metrology of chrome-less masks using optical digital profilometry [6283-111]
- Author(s):
- Lee, K. ( Intel Corp. (USA) )
- Yedur, S. ( Timbre Technologies (USA) )
- Cheng, W.
- Tovassoli, M.
- Baik, K. ( Intel Corp. (USA) )
- Publication title:
- Photomask and Next-Generation Lithography Mask Technology XIII
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6283
- Pub. Year:
- 2006
- Pt.:
- 1
- Page(from):
- 628313
- Page(to):
- 628313
- Pages:
- 1
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819463586 [0819463582]
- Language:
- English
- Call no.:
- P63600/6283
- Type:
- Conference Proceedings
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