1.

Conference Proceedings

Conference Proceedings
Stevie, F.A. ; Persson, E. ; DeBusk, D.K. ; Savchuk, A. ; Hoff, A.M. ; Edelman, P. ; Lagowski, J.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.357-364,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-12
2.

Conference Proceedings

Conference Proceedings
Sun, Q. ; Lagowski, J. ; Gatos, H. C.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.205-208,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
3.

Conference Proceedings

Conference Proceedings
Nauka, K. ; Lagowski, J. ; Gatos, H. C.
Pub. info.: Impurity diffusion and gettering in silicon : symposium held November 27-30, 1984, Boston, Massachusetts, U.S.A..  pp.175-180,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 36
4.

Conference Proceedings

Conference Proceedings
Gatos, H. C. ; Lagowski, J.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.153-168,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
5.

Conference Proceedings

Conference Proceedings
Nauka, K. ; Gatos, H. C. ; Lagowski, J.
Pub. info.: Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.177-180,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 14
6.

Conference Proceedings

Conference Proceedings
L:I, C.-J. ; Sun, Q. ; Lagowski, J. ; Gatos, H. C.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.441-446,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
7.

Conference Proceedings

Conference Proceedings
Nauka, K. ; Walukiewicz, W. ; Lagowski, J. ; Gatos, H. C.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.291-296,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
8.

Conference Proceedings

Conference Proceedings
Ueda, O. ; Nauka, K. ; Lagowski, J. ; Gatos, H.C.
Pub. info.: Materials issues in silicon integrated circuit processing : symposium held April 15-18, 1986, Palo Alto, California, U.S.A..  pp.21-26,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 71
9.

Conference Proceedings

Conference Proceedings
Skowronski, M. ; Lin, D. G. ; Lagowski, J. ; Pawlowicz, L..M. ; Ko, K. Y. ; Gatos, H. C.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.207-212,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
10.

Conference Proceedings

Conference Proceedings
Kontkiewicz, A. M. ; Lagowski, J. ; Dexter, M. ; Edelman, P.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.439-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324