Nauka, K. ; Walukiewicz, W. ; Lagowski, J. ; Gatos, H. C.
Pub. info.:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.291-296, 1985. Pittsburgh, Pa.. Materials Research Society
Becla, P. ; Witt, A. G. ; Lagowski, J. ; Walukiewicz, W.
Pub. info.:
Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.. pp.47-, 1995. Pittsburgh, PA. MRS - Materials Research Society