1.

Conference Proceedings

Conference Proceedings
Nauka, K. ; Walukiewicz, W. ; Lagowski, J. ; Gatos, H. C.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.291-296,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
2.

Conference Proceedings

Conference Proceedings
Becla, P. ; Witt, A. G. ; Lagowski, J. ; Walukiewicz, W.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.47-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
3.

Technical Paper

Technical Paper
Lagowski, J. ; Gatos, H. C. ; Aoyama, T. ; Lin, D. G. ; Ruda, H. E. ; Walukiewicz, W. ; Le, Wang ; Pawlowicz, L.
Pub. info.: NASA Technical Reports.  (NASA-TM-87568),  pp.1-1,  1985.  National Aeronautics and Space Administration