1.

Conference Proceedings

Conference Proceedings
Kontkiewicz, A. M. ; Lagowski, J. ; Dexter, M. ; Edelman, P.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.439-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324
2.

Conference Proceedings

Conference Proceedings
Sen, S. ; Kontkiewicz, A. J. ; Kontkiewicz, A. M. ; Nowak. G. ; Siejka, J. ; Sakthivel, P. ; Ahmed, K. ; Mukherjee, P. ; Witanachchi, S. ; Hoff, A. M. ; Lagowski, J.
Pub. info.: Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.369-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 358