Beyer, G.P., Baklanov, M., Conard, T., Maex, K.
Materials Research Society
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Q. T. Le, G. Vereecke, A. Bertha, E. Kesters, M. Lux, H. Struyf
Materials Research Society
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Q. T. Le, J. Van Olmen, R. Vanderheyden, E. Kesters, K. Kenis, T. Conard, W. Boullart, M. R. Baklanov, S. …
Electrochemical Society
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Ivan Ciofi, Mikhail R. Baklanov, Giovanni Calbo, Zsolt Tokei, Gerald Beyer
Materials Research Society
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Li, DeQuan, Huckett, Sara C., Frankcom, Tracey, Paffett, M. T., Farr, J. D., Hawley, M. E., Gottesfeld, S., Thompson, J. …
American Chemical Society
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Carbonell, L., Vereecke, G., Van Elshocht, S., Caymax, M., Van Hove, M., Maex, K., Mertens, P.
SPIE-The International Society for Optical Engineering
|
V. V. Afanas'ev, K. Keunen, A. P. D. Nguyen, M. Jivanescu, A. Stesmans, Zs. Tokei, M. R. Baklanov, G. P. Beyer
Materials Research Society
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Carbonell, L., Vereecke, G., Van Elshocht, S., Caymax, M., Van Hove, M., Maex, K., Mertens, P.
Electrochemical Society
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Baklanov, M. R., Vanhaelemeersch, S., Alaerts, C., Maex, K.
MRS - Materials Research Society
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Nakajima K., Kawasaki T., Nakihama T., Owari Y., Minamikawa H.
SPIE - The International Society of Optical Engineering
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Ishow, E., Nakatani, K., Delaire, J., Qiu, L.
Kluwer Academic Publishers
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Okoroanyanwu, U., Stepanenko, N., Vereecke, G., Eliat, A., Kocsis, M.K., Kang, Y.S., Jonckheere, R.M., Conard, T., …
SPIE - The International Society of Optical Engineering
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