1.

Conference Proceedings
Conference Proceedings
1. Optical absorption and Zeeman study of the 6H SiC:Cr
Dornen,A. ; Kaufmann,B. ; Baur,J. ; Kunzer,M. ; Kaufmann,U. ; Baranov,P.G.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.697-702,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Characterization of Residual Transition Metal Ions in GaN and AlN
Baur,J. ; Kaufinann,U. ; Kunzer,M. ; Schneider,J. ; Amano,H. ; Akasaki,I. ; Detchprohm,T. ; Hiramatsu,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.55-60,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201