1.

Conference Proceedings
Conference Proceedings
1. Optical sensors for process control and emissions monitoring in industry
Allendorf,S.W. ; Ottesen,D.K. ; Hahn,D.W. ; Kulp,T.J. ; Goers,U.B.
Pub. info.: Advanced sensors and monitors for process industries and the environment : 4-5 November 1998, Boston, Massachusetts.  pp.2-13,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3535
2.

Conference Proceedings
Conference Proceedings
2. PPLN laser-based system for chemical imaging
Ludowise,P.D. ; Ottesen,D.K. ; Kulp,T.J. ; Goers,U.B ; Celina,M. ; Armstrong,K. ; Allendorf,S.W.
Pub. info.: Imaging spectrometry V : 19-21 July 1999, Denver, Colorado.  pp.51-60,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3753