1.

Conference Proceedings
Conference Proceedings
1. Dynamic classification of fringe patterns in holographic interferometry by optical wavelet filtering
Kallmeyer, F. ; Krueger, S. ; Wernicke, G.K. ; Gruber, H. ; Kayser, D.
Pub. info.: Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA.  pp.251-260,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5011
2.

Conference Proceedings
Conference Proceedings
2. Detection of faults in interferometric fringe patterns by optical wavelet filtering
Wernicke, G.K. ; Kallmeyer, F. ; Krueger, S. ; Gruber, H. ; Kayser, D.
Pub. info.: Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway.  pp.218-225,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4933
3.

Conference Proceedings
Conference Proceedings
3. Spatial light modulator system as dynamic diffractive element
Krueger, S. ; Steinhoff, A. ; Kallmayer, F. ; Wernicke, G.K. ; Gruber, H.
Pub. info.: Liquid Crystal Materials, Devices, and Applications IX.  pp.142-149,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5003
4.

Conference Proceedings
Conference Proceedings
4. Highly efficient optical reconstruction of digital holograms for deformation and shape control
Wernicke, G.K. ; Krueger, S. ; Steinhoff, A. ; Zeug, A. ; Gruber, H.
Pub. info.: Optical Measurement Systems for Industrial Inspection III.  pp.124-131,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5144
5.

Conference Proceedings
Conference Proceedings
5. Optical processing for the detection of faults in interferometric patterns
Kallmeyer, F. ; Krueger, S. ; Wernicke, G.K. ; Gruber, H. ; Demoli, N. ; Osten, W. ; Kayser, D.
Pub. info.: Interferometry XI: Techniques and Analysis.  pp.371-381,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4777