Kirscht, F. ; Orschel, B. ; Kim, S. ; Rouvimov, S. ; Snegirev, B. ; Fletcher, M. ; Shabani, M. ; Buczkowski, A.
Pub. info.:
Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.173-178, 2002. Warrendale, Pa. Materials Research Society
Kirscht, F. ; Snegirev, B. ; Zaumseil, P. ; Kissinger, G. ; Takashima, K. ; Wildes, P. ; Hennessy, J.
Pub. info.:
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.60-67, 1997. Pennington, NJ. Electrochemical Society