Application of outlier analysis for baseline-free damage diagnosis [6174-50]
- Author(s):
- Kim, S. D. ( Carnegie Mellon Univ. (USA) )
- In, C. W. ( Carnegie Mellon Univ. (USA) )
- Cronin, K. E. ( Carnegie Mellon Univ. (USA) )
- Sohn, H. ( Carnegie Mellon Univ. (USA) )
- Harries, K. ( Univ. of Pittsburgh (USA) )
- Publication title:
- Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6174
- Pub. Year:
- 2006
- Pt.:
- 1
- Page(from):
- 61741H
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819462275 [0819462276]
- Language:
- English
- Call no.:
- P63600/6174
- Type:
- Conference Proceedings
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