1.

Conference Proceedings
Conference Proceedings
1. Characterization of Chromium-Carbon Layer Fabricated by Electrodeposition in Trivalent Chromium Bath
Kim, M. ; Park, S. U. ; Kim, D. Y. ; Kwon, S. C. ; Choi, Y.
Pub. info.: PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China.  pp.3823-3826,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 475-479(5)
2.

Conference Proceedings
Conference Proceedings
2. Effect of Solution Chemistry and Electroplating Conditions on the Deposition Rate and Wear Resistance of Eco-Friendly Trivalent Chromium Layers
Choi, M. Y. ; Choi, Y. ; Choe, J. I. ; Kim, M. ; Kwon, S. C.
Pub. info.: PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China.  pp.4005-4008,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 475-479(5)
3.

Conference Proceedings
Conference Proceedings
3. Evaluation of Nano-Size Defects of Chromium Layers by Small Angle Neutron Scattering
Choi, Y. ; Choi, M. Y. ; Hahn, Y. S. ; Kim, M. ; Kwon, S. C.
Pub. info.: PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China.  pp.3815-3818,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 475-479(5)
4.

Conference Proceedings
Conference Proceedings
4. Multi-point CD measurement method to evaluate pattern fidelity and performance of mask [6349-155]
Kim, M. ; Lee, H. ; Seo, K. ; Lee, D. ; Choi, Y. ; Oh, S. ; Han, O.
Pub. info.: Photomask Technology 2006.  pp.634944-634945,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349
5.

Conference Proceedings
Conference Proceedings
5. The CD measuring repeatability enhancement by intensity gradient [6283-49]
Choi, Y. ; Kim, S. ; Kim, M. ; Han, O.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XIII.  pp.62832F-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6283
6.

Conference Proceedings
Conference Proceedings
6. CD measurement evaluation on periodic patterns between optic tools and CD-SEM [6349-60]
Choi, Y. ; Kim, M. ; Oh, S. ; Han, O.
Pub. info.: Photomask Technology 2006.  pp.63491N-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349