1.

Conference Proceedings

Conference Proceedings
Kim, K.-S. ; Chung, C. ; Kim, H.-J.
Pub. info.: Smart structures and materials 2003 : Industrial and commercial applications of smart structures technologies : 4-6 March 2003, San Diego, California, USA.  pp.240-251,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5054
2.

Conference Proceedings

Conference Proceedings
Kim, K.-S. ; Cho, S.-K. ; Bae, B.-W.
Pub. info.: Smart structures and materials 2003 : Industrial and commercial applications of smart structures technologies : 4-6 March 2003, San Diego, California, USA.  pp.252-262,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5054
3.

Conference Proceedings

Conference Proceedings
Kim, N.-K. ; Kim, K.-S. ; Kim, N.-H. ; Chang, E.-G.
Pub. info.: State-of-the-art program on compound semiconductors XXXIX and nitride and wide bandgap semiconductors for sensors, photonics, and electronics IV : proceedings of the international symposia.  pp.80-86,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-11
4.

Conference Proceedings

Conference Proceedings
Kim, J.-B. ; Kim, K.-S.
Pub. info.: Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA.  pp.467-475,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5753(1)
5.

Conference Proceedings

Conference Proceedings
Kim, K.-S. ; Chung, C.
Pub. info.: Smart structures and materials 2003 : Smart sensor technology and measurement systems : 3-5 March 2003, San Diego, California, USA.  pp.152-158,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5050
6.

Conference Proceedings

Conference Proceedings
Ganesan, R. ; Choi, J.-H. ; Yun, H.-J. ; Kwon, Y.-G. ; Kim, K.-S. ; Oh, T.-H. ; Kim, J.-B.
Pub. info.: Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA.  pp.40-51,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5753(1)
7.

Conference Proceedings

Conference Proceedings
Choi, Y. ; Kim, K.-S. ; Kim, J.-H. ; Seo, G.
Pub. info.: Zeolites and mesoporous materials at the dawn of the 21st century : proceedings of the 13th International Zeolite Conference, Montpellier, France, 8-13 July 2001.  pp.139-139,  2001.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 135
8.

Conference Proceedings

Conference Proceedings
Lee, S.-Y. ; Lee, S.-H. ; Eom, D.-H. ; Kim, K.-S. ; Song, H.-S. ; Park, J.-G.
Pub. info.: Cleaning technology semiconductor device manufacturing : proceedings of the seventh international symposium.  pp.180-186,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-26
9.

Conference Proceedings

Conference Proceedings
Eom, D.-H. ; Lee, S.-H. ; Kim, K.-S. ; Lee, C.-H. ; Park, J.-G.
Pub. info.: Cleaning technology semiconductor device manufacturing : proceedings of the seventh international symposium.  pp.156-163,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-26
10.

Conference Proceedings

Conference Proceedings
Yu, H.H. ; Shrotriya, P. ; Wang, J. ; Kim, K.-S.
Pub. info.: Thin films : stresses and mechanical properties X : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A..  pp.301-306,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 795