1.

Conference Proceedings
Conference Proceedings
1. The Dependence of Cu Removal Efficiency on the Initial Cu Concentration of Si Surface
Kim, J.-S. ; Morita, H. ; Joo, J.-D. ; Ohmi, T.
Pub. info.: ULSI science and technology, 1997 : proceedings of the Sixth International Symposium on Ultralarge Scale Integration Science and Technology.  pp.199-210,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-3
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Conference Proceedings
Conference Proceedings
2. PASSIVATION OF Cu PARTICLES ON Si SUBSTRATE BY FOM(HF+O3- UPW) SOLUTION
Morita, H. ; Joo, J.-D. ; Messoussi, R. ; Kawada, K. ; Kim, J.-S. ; Ohmi, T.
Pub. info.: Proceedings of the Fifth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.143-150,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-35
3.

Conference Proceedings
Conference Proceedings
3. THE EFFECT OF SURFACE DAMAGE DUE TO Si INPLANTATION ON ADSORPTION AND DESORPTION OF Cu ON Si SURFACE -
Kim, J.-S. ; Morita, H. ; Joo, J.-D. ; Ohmi, T.
Pub. info.: Proceedings of the Fifth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.151-158,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-35
4.

Conference Proceedings
Conference Proceedings
4. Fabrication and Characteristics of High Speed Implant-Confined, Index-Guided, Lateral-current, 850 nm Vertical Cavity Surface Emitting Lasers*
Park, K.-Y. ; Chol, H.-H. ; Kim, H.-K. ; Kim, J.-S. ; Kwon, S.-Y. ; Choi, S.-Y.
Pub. info.: State-of-the-art program on compound semiconductors XXXVI and wide bandgap semiconductors for photonic and electronic devices and sensors II : proceedings of the international symposia.  pp.213-224,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-3
5.

Conference Proceedings
Conference Proceedings
5. Selective Etching of Intermetallic Inclusions from the Surface of Aluminum AA 2024 Alloys
Chen, U. ; Buttry, D. ; Williams, M. ; Malmberg., J. ; Kim, J.-S.
Pub. info.: Corrosion and corrosion prevention of low density metals and alloys : proceedings of the International Symposium.  pp.29-40,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-23
6.

Conference Proceedings
Conference Proceedings
6. COMPARISON OF CLEANING EFFICIENCIES OF NOBEL METALS ON Si SURFACES BETWEEN O3-UPW AND SPM
Joo, J.-D. ; Kim, J.-S. ; Morita, H. ; Ohmi, T.
Pub. info.: Proceedings of the Fifth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.280-288,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-35
7.

Conference Proceedings
Conference Proceedings
7. Thermal Behavior of Cathode Materials in Li-Ion Battery (LiCoO2, LiNi0.8Co0.2O2, and LiMn2O4)
Kim, J.-S. ; Prakaslr., J. ; Selman, J.R.
Pub. info.: Rechargeable lithium batteries : proceedings of the international symposium.  pp.409-420,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-21
8.

Conference Proceedings
Conference Proceedings
8. Performance comparisons of planar and volumetric observers for lesion detection in PET scanning
Kim, J.-S. ; Kinahan, P.E. ; Lartizien, C. ; Comtat, C. ; Lewellen, T.K.
Pub. info.: Medical imaging 2003 : Image perception, observer performance, and technology assessment : 18-20 February 2003, San Diego, California, USA.  pp.89-99,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5034
9.

Conference Proceedings
Conference Proceedings
9. EUV microexposures at the ALS using the 0.3-NA MET projection optics
Jeon, Y.-D. ; Choi, M.-K. ; Kim, E.-J. ; Kim, J.-S. ; Oh, H.-K.
Pub. info.: Emerging lithographic technologies IX : 1-3 March 2005, San Jose, California, USA.  pp.56-63,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5751
10.

Conference Proceedings
Conference Proceedings
10. SWIR diodes of HgCdTe on GaAs substrates grown by metal organic vapor phase epitaxy
Kim, J.-S. ; An, S.-Y. ; Suh, S.-H.
Pub. info.: Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA.  pp.207-212,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4795