1.

Conference Proceedings
Conference Proceedings
1. Hot Carrier Effects in Self-Aligned and Offset-Gated Polysilicon Thin-Film Transistors
Arpatzanis, N. ; Hatzopoulos, A.T. ; Tassis, D.H. ; Dimitriadis, Charalambos ; Kamarinos, G.
Pub. info.: Materials and devices for smart systems II : symposium held November 28-December 1, 2005, Boston, Massachusetts, U.S.A..  pp.353-358,  2006.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 888
2.

Conference Proceedings
Conference Proceedings
2. Use of Non-Contact Resistivity Measurements for Epitaxy: Surface Charge Profiler Method
Danel, A. ; Tardif, F. ; Kamarinos, G. ; Nguyen, M.C.
Pub. info.: Proceedings of the Fifth International Symposium on High Purity Silicon V.  pp.444-455,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-13
3.

Conference Proceedings
Conference Proceedings
3. Sensitivity of the surface charge profiler (SCP) method for some monitoring applications
Danel, A. ; Lardin, T. ; Kamarinos, G. ; Tardif, F.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.394-403,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
4.

Conference Proceedings
Conference Proceedings
4. Detection of noble metals in HF based chemistries by microwave photoconductive decay (μ-PCD)
Tardif, F. ; Joly, J.-P. ; Courteaux, A. ; Straube, U. ; Danel, A. ; Kamarinos, G.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.385-393,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
5.

Conference Proceedings
Conference Proceedings
5. MONITORING OF NOBLE METALS IN HF BASED CHEMISTRIES USING μ-PCD,SPV,SCI, and SCP
Danel, A. ; Straube, U. ; Kamarinos, G. ; Kamieniecki, E. ; Tardif, F.
Pub. info.: Proceedings of the Fifth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.400-407,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-35
6.

Conference Proceedings
Conference Proceedings
6. Characterization of copper and nickel contamination using recombination lifetime techniques
Walz, D. ; Joly, J.P. ; Suarez, M. ; Palleau, J. ; Kamarinos, G.
Pub. info.: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.64-72,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-30
7.

Conference Proceedings
Conference Proceedings
7. Comparative study of on-line lifetime techniques for the monitoring of metallic micro contamination for ULSI microelectronics
Walz, D. ; Joly, J.P. ; Kamarinos, G. ; Barla, K.
Pub. info.: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.35-43,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-30
8.

Conference Proceedings
Conference Proceedings
8. Stability of Non-Hydrogenated and Hydrogenated P-Channel Polycrystalline Silicon Thin-Film Transistors
Hastas, N.A. ; Dimitriadis, C.A. ; Kamarinos, G.
Pub. info.: Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.457-462,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 744