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Conference Proceedings

1. Nanocrystal Thickness Information From Z-STEM: 3-D Imaging in One Shot

Erwin, M. ; Kadavanich, A. V. ; Kippeny, T. ; Pennycook, S. J. ; Rosenthal, S. J.

Pub. info.:	Advances in materials problem solving with the electron microscope : symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A.. pp.229-234, 2001. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	589

Conference Proceedings

2. Structural Investigations of Colloidal Semiconductor Nanocrystal Heterostructures: Faceting and Epitaxy

Kadavanich, A. V. ; Mews, A. ; Tolbert, S. H. ; Peng, X. ; Schlamp, M. C. ; Lee, J. C. ; Alivisatos, A. P.

Pub. info.:	Advances in microcrystalline and nanocrystalline semiconductors, 1996 : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.353-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	452

Conference Proceedings

3. Z-contrast STEM imaging and EELS of CdSe nanocrystals: Towards the analysis of individual nanocrystal surfaces

Kadavanich, A. V. ; Kippeny, T. ; Erwin, M. ; Rosenthal, S. J. ; Pennycook, S. J.

Pub. info.:	Semiconductor quantum dots : symposium held April 5-8, 1999, San Francisco, California, U.S.A.. pp.305-, 2000. Warrendale, PA. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	571

Conference Proceedings

4. Z-contrast STEM imaging and EELS of CdSe nanocrystals: Towards the analysis of individual nanocrystal surfaces

Kadavanich, A. V. ; Kippeny, T. ; Erwin, M. ; Rosenthal, S. J. ; Pennycook, S. J.

Pub. info.:	Nanophase and nanocomposite materials III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.. pp.503-, 2000. Pittsburgh, Pa.. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	581