1.

Conference Proceedings

Conference Proceedings
Gobel,C. ; Sehrepel,C. ; Scherz,U. ; Thurian,P. ; Kaczmarczyk,G. ; Hoffmann,A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1173-1178,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Stemer,H. ; Schewiola,A. ; Karch,K. ; Pavone,P. ; Strauch,D. ; Siegle,H. ; Kaczmarczyk,G. ; Filippidis,L. ; Thomsen,C.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.307-310,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings

Conference Proceedings
Thurian,P. ; Kaczmarczyk,G. ; Siegle,H. ; Heitz,R. ; Hoffmann,A. ; Broser,I. ; Meyer,B.K. ; Hoffbauer,R. ; Scherz,U.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1571-1576,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201