Phillips, Julia M. ; Hensel, J.C. ; Joy, D.C. ; Augustyniak, W.M.
Pub. info.:
Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A.. pp.609-614, 1987. Pittsburgh, Pa.. Materials Research Society
Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.163-170, 1985. Pittsburgh, Pa.. Materials Research Society
High-Temperature ordered intermetallic alloys III : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.. pp.311-316, 1989. Pittsburgh, Pa.. Materials Research Society
Twigg, M.E. ; Chu, S.N.G. ; Joy, D.C. ; Maher, D.M. ; Macrander, A.T. ; Nakahara, S. ; Chin, A.K.
Pub. info.:
Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A.. pp.147-152, 1986. Pittsburgh, Pa.. Materials Research Society
Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A.. pp.171-176, 1986. Pittsburgh, Pa.. Materials Research Society
Rapid thermal processing : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.93-106, 1985. Pittsburgh, Pa.. Materials Research Society
Design and process integration for microelectronic manufacturing II : 26-28 February 2003, Santa Clara, California, USA. pp.251-277, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A.. pp.29-38, 1985. Pittsburgh, Pa.. Materials Research Society
Oxygen, carbon, hydrogen, and nitrogen in crystalline silicon : symposium held December 2-5, 1985, Boston, Massachusetts, U.S.A.. pp.317-322, 1986. Pittsburgh, Pa.. Materials Research Society
Phillips, J.M. ; Manger, M.L. ; Pfeiffer, L. ; Joy, D.C. ; Smith III, T.P. ; Augustyniak, W.M. ; West, K.W.
Pub. info.:
Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A.. pp.155-162, 1985. Pittsburgh, Pa.. Materials Research Society
Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A.. pp.289-300, 1985. Pittsburgh, Pa.. Materials Research Society
ALT'01 International Conference on Advanced Laser Technologies, 11-14 September, 2001, Constanta, Romania. pp.268-277, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVI. Part One pp.1-10, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVI. Part One pp.576-583, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVI. Part One pp.565-575, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Rack, P.D. ; Thesen, A. ; Randolph, S. ; Fowlkes, J.D. ; Joy, D.C.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XVII. 2 pp.943-949, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.10-17, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVII. 1 pp.293-302, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering