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RELATIVE LATTICE PARAMETER MEASUREMENT IN QUATERNARY (InGaAsP) LAYERS ON InP SUBSTRATES USING CONVERGENT BEAM ELECTRON DIFFRACTION

Author(s):
Twigg, M.E.
Chu, S.N.G.
Joy, D.C.
Maher, D.M.
Macrander, A.T.
Nakahara, S.
Chin, A.K.
2 more
Publication title:
Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
69
Pub. Year:
1986
Page(from):
147
Page(to):
152
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837357 [0931837359]
Language:
English
Call no.:
M23500/69
Type:
Conference Proceedings

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