1.

Conference Proceedings
Conference Proceedings
1. Application of the stretched exponential function to fluorescence lifetime imaging of biological tissue
Siegel,J. ; Lee,K.C.Benny ; Webb,S.E.D. ; Leveque-Fort,S. ; Cole,M.J. ; Jones,R. ; Dowling,K. ; French,P.M.W. ; Lever,M.J.
Pub. info.: Photon migration, optical coherence tomography, and microscopy : 18-21 June 2001, Munich, Germany.  pp.99-107,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4431
2.

Conference Proceedings
Conference Proceedings
2. Passivation and Reactivation of(H,P)Pairs in Si
Estreicher,S.K. ; Jones,R.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1215-1220,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. Monitoring of crack growth beneath a bonded repair using Bragg gratings
McKenzie,I. ; Jones,R. ; Chiu,W.K. ; Booth,D. ; Galea,S.C.
Pub. info.: Smart electronics and MEMS : 11-13 December 1997, Adelaide, Australia.  pp.272-283,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3242
4.

Conference Proceedings
Conference Proceedings
4. Theory of nitrogen and platelets in diamond
Briddon,P.R. ; Heggie,M.I. ; Jones,R.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.457-462,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
5.

Conference Proceedings
Conference Proceedings
5. Interaction of hydrogen with impurities in semiconductors
Jones,R. ; Oberg,S. ; Umerski,A.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.551-562,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
6.

Conference Proceedings
Conference Proceedings
6. Time-gated holographic imaging using photorefractive multiple quantum well devices
Jones,R. ; Barry,N.P. ; Hyde,S.C.W. ; Dainty,J.C. ; French,P.M.W. ; Kwolek,K.M. ; Nolte,D.D. ; Melloch,M.R.
Pub. info.: Proceedings of coherence domain optical methods in biomedical science and clinical applications : 12-14 February 1997, San Jose, California.  pp.192-199,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2981
7.

Conference Proceedings
Conference Proceedings
7. Novel ultrafast tunable solid state lasers for real-world applications including medical imaging (Invited Paper)
Barry,N.P. ; Dainty,C. ; Dowling,K. ; French,P.M.W. ; Hyde,S.C.W. ; Jones,R. ; Mellish,R. ; Sutherland,J.M. ; Taylor,J.R. ; Tong,Y.P. ; Chai,B.H.T. ; Van der Poel,C.J. ; Valster,A.
Pub. info.: Tunable solid state lasers : 1-4 September 1996, Wrocław, Poland.  pp.304-313,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3176
8.

Conference Proceedings
Conference Proceedings
8. Depth-resolved holography using photorefractive media
Barry,N.P. ; Jones,R. ; Hyde,S.C.W. ; Dainty,J.C. ; French,P.M.W. ; Kwoleck,K.M. ; Nolte,D.D. ; Melloch,M.R.
Pub. info.: Proceedings of biomedical systems and technologies : 8-10 September 1996, Vienna, Austria.  pp.248-258,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2928
9.

Conference Proceedings
Conference Proceedings
9. High-resolution real-time 3D imaging using time-gated photorefractive holography
Tziraki,M. ; Jones,R. ; Parsons-Karavassilis,D. ; French,P.M.W. ; Kwolek,K.M. ; Nolte,D.D. ; Melloch,M.R.
Pub. info.: Proceedings of coherence domain optical methods in biomedical science and clinical applications II : 27-28 January 1998, San Jose, California.  pp.76-84,  1998.  Bellingham.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3251
10.

Conference Proceedings
Conference Proceedings
10. Fluorescence lifetime imaging for biomedicine using all-solid state ultrafast laser technology
Jones,R. ; Dowling,K. ; Cole,M.J. ; Parsons-Karavassilis,D. ; French,P.M.W. ; Lever,M.J. ; Hares,J.D. ; Dymoke-Bradshaw,A.K.L.
Pub. info.: Commercial and biomedical applications of ultrafast lasers : 28-29 January 1999, San Jose, California.  pp.86-91,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3616
11.

Conference Proceedings
Conference Proceedings
11. Time-gated holographic imaging using photorefractive media
Ansari,Z. ; Gu,Y. ; Tziraki,M. ; Parsons-Karavassilis,D. ; Jones,R. ; French,P.M.W. ; Nolte,D.D. ; Melloch,M.R.
Pub. info.: Photon migration, diffuse spectroscopy, and optical coherence tomography : imaging and functional assessment, 6-8 July 2000, Amsterdam, The Netherlands.  pp.1-7,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4160
12.

Conference Proceedings
Conference Proceedings
12. Real-time holography for optical processing using photorefractive crystals
Kukhtarev,N.V. ; Kukhtareva,T.V. ; Jones,R. ; Wang,J.-C. ; Banerjee,P.P.
Pub. info.: Operational characteristics and crystal growth of nonlinear optical materials : 19-20 July 1999, Denver, Colorado.  pp.90-102,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3793
13.

Conference Proceedings
Conference Proceedings
13. Fast all-optical spatial-temporal light modulator
Kukhtarev,N. ; Kukhtareva,T.V. ; Jones,R. ; Frazier,D.O. ; Penn,B.G. ; Abdeldayem,H.A.
Pub. info.: Enabling photonic technologies for aerospace applications II : 24-25 April 2000, Orlando, USA.  pp.140-145,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4042
14.

Conference Proceedings
Conference Proceedings
14. New concept of transient functionally graded material for thermoelectric power conversion
Kukhtarev,N. ; Kukhtareva,T.V. ; Ward,E. ; Jones,J. ; Jones,R. ; Shnitser,P.I.
Pub. info.: Enabling photonic technologies for aerospace applications II : 24-25 April 2000, Orlando, USA.  pp.146-155,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4042
15.

Conference Proceedings
Conference Proceedings
15. Theory of nitrogen-hydrogen complexes in GaP
Torres,V.J.B. ; Oberg,S. ; Jones,R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1063-1068,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
16.

Conference Proceedings
Conference Proceedings
16. Theory of Carbon Complexes in Gallium Arsenide and Aluminium Arsenide
Jones,R. ; Oberg,S.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.253-258,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
17.

Conference Proceedings
Conference Proceedings
17. Theory of Dislocations in GaAs
Jones,R. ; Sitch,P. ; Oberg,S. ; Heggie,M.I.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1605-1610,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
18.

Conference Proceedings
Conference Proceedings
18. The hydrogen-saturated self-interstitial iu silicon and germanium
Budde,M. ; Nielsen,B.Bech ; Leary,P. ; Goss,J. ; Jones,R. ; Briddon,P.R. ; Oberg,S. ; Breuer,S.J.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.35-40,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
19.

Conference Proceedings
Conference Proceedings
19. Substitutional carbon in Ge and Si1-xGex
Hoffmann,L. ; Bach,J.C. ; Hansen,J.Lundsgaard ; Larsen,A.Nylandsted ; Nielsen,B.Bech ; Leary,P. ; Jones,R. ; Oberg,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.97-102,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
20.

Conference Proceedings
Conference Proceedings
20. Breakdown of the vacancy model for impurity-vacancy defects in diamond
Goss,J.P. ; Jones,R. ; Briddon,P.R. ; Oberg,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.775-780,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
21.

Conference Proceedings
Conference Proceedings
21. A frst principles study of interstitial Si in diamond
Goss,J.P. ; Jones,R. ; Breuer,S.J. ; Briddon,P.R. ; Oberg,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.781-786,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
22.

Conference Proceedings
Conference Proceedings
22. Observation and Theory of the H2 Defect in Silicon
Nielsen,B.Bech ; Holbech,J.D. ; Jones,R. ; Sitch,P. ; Oberg,S.(invited)
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.845-852,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
23.

Conference Proceedings
Conference Proceedings
23. The Nitrogen Pair in Crystalline Silicon Studied by Ion Channeling
Rasmussen,F.Berg ; Nielsen,B.Bech ; Jones,R. ; Oberg,S.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1221-1226,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
24.

Conference Proceedings
Conference Proceedings
24. Theory of Nitrogen Aggregates in Diamond:The H3 and H4 Defects
Jones,R. ; Torres,V.J.B. ; Briddon,P.R. ; Oberg,S.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.45-50,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
25.

Conference Proceedings
Conference Proceedings
25. First Principles Investigation of Vacancy Oxygen Defects in Si
Ewels,C.P. ; Jones,R. ; Oberg,S.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1297-1302,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
26.

Conference Proceedings
Conference Proceedings
26. Struetural and electrical properties of threading dislocations in GaN
Elsner,J. ; Jones,R. ; Sitch,P.K. ; Frauenheim,Th. ; Heggie,M.I. ; Oberg,S. ; Briddon,P.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1203-1210,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
27.

Conference Proceedings
Conference Proceedings
27. Local vibrational modes of a weakly bound O-H complexes in Si.(Invited)
Nielsen,B.Bech ; Tanderup,K. ; Budde,M. ; Nieisen,K.Bonde ; Lindstrom,J.L. ; Jones,R. ; Oberg,S. ; Hourahine,B. ; Briddon,P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.391-398,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
28.

Conference Proceedings
Conference Proceedings
28. Theory of gold-hydrogen complexes in silicon
Resende,A. ; Goss,J. ; Briddon,P.R. ; Oberg,S. ; Jones,R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.295-300,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
29.

Conference Proceedings
Conference Proceedings
29. The H2 Defect in Crystalline Germaniium
Budde,M. ; Nielsen,B.Bech ; Jones,R. ; Oberg,S. ; Goss,S.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.879-884,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
30.

Conference Proceedings
Conference Proceedings
30. Anomalous shift of the 1075 cm-1 oxygen-hydrogen defect iu silicon
Hourahine,B. ; Jones,R. ; Oberg,S. ; Briddon,P.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.277-282,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
31.

Conference Proceedings
Conference Proceedings
31. The NNO Defect in Silicon
Rasmussen,F.Berg ; Oberg,S. ; Jones,R. ; Ewels,C. ; Goss,J. ; Miro,J. ; Deak,P.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.791-796,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
32.

Conference Proceedings
Conference Proceedings
32. Interstitial carbQn-hydrogen defects in silicon
Leary,P. ; Oberg,S. ; Briddon,P.R. ; Jones,R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.264-270,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
33.

Conference Proceedings
Conference Proceedings
33. Peculiarities of Interstitial Carbon and Di-Carbon Defects in Si
Jones,R. ; Oberg,S. ; Leary,P. ; Torres,V.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.785-790,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
34.

Conference Proceedings
Conference Proceedings
34. Ni Complexes in Diamond
Goss,J. ; Resende,A. ; Jones,R. ; Oberg,S. ; Briddon,P.R.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.67-72,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
35.

Conference Proceedings
Conference Proceedings
35. Time-gated holographic imaging using photorefractive media
Jones,R. ; Barry,N.P. ; Hyde,S.C.W. ; Dowling,K. ; Dainty,J.C. ; French,P.M.W. ; Wechsler,B.A. ; Klein,M.B.
Pub. info.: Proceedings of optical imaging techniques for biomonitoring : 14-16 September 1995, Barcelona, Spain.  pp.166-174,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2628
36.

Conference Proceedings
Conference Proceedings
36. Whole-field coherent imaging through turbid media using photorefractive holography
Tziraki,M. ; Jones,R. ; French,P.M.W. ; Kwolek,K.M. ; Nolte,D.D. ; Melloch,M.R.
Pub. info.: Saratov fall meeting '99 : optical technologies in biophysics and medicine : International Workshop and Fall School for Young Scientists and Students on Optics, Laser Physics, and Biophysics : 5-8 October 1999, Saratov, Russia.  pp.135-144,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4001
37.

Conference Proceedings
Conference Proceedings
37. Theory of Si ｦﾄ-Doped GaAs
Jones,R. ; Oberg,S.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.415-420,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
38.

Conference Proceedings
Conference Proceedings
38. Theory of the NiH2 Complex in Si and the CuH2 Complex in GaAs
Jones,R. ; Goss,J. ; Oberg,S. ; Briddon,P.R. ; Resende,A.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.921-926,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
39.

Conference Proceedings
Conference Proceedings
39. Interstitial Hydrogen and the Dissociation of C-H Defects in GaAs
Breuer,S.J. ; Jones,R. ; Oberg,S. ; Briddon,P.R.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.951-956,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
40.

Conference Proceedings
Conference Proceedings
40. Vacancy- and Acceptor-H Complexes in InP
Ewels,C.P. ; Oberg,S. ; Jones,R. ; Pajot,B. ; Briddon,P.R.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.969-974,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
41.

Conference Proceedings
Conference Proceedings
41. H Interacting with Intrinsic Defects in Si
Nielsen,B.Bech ; Hoffmann,L. ; Budde,M. ; Jones,R. ; Goss,J. ; Oberg,S.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.933-938,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
42.

Conference Proceedings
Conference Proceedings
42. Sensor technology for structural integrity monitoring
Jones,R. ; Chiu,W.K. ; Pitt,S.
Pub. info.: Third international conference on intelligent materials : third European conference on smart structures and materials, Lyon/3-4-5 June 1996, center of congress "L'Espace tete d'or".  pp.124-129,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2779
43.

Technical Paper
Technical Paper
43. Test Results for Entry Guidance Methods for Reusable Launch Vehicles
Hanson,J. ; Jones,R.
Pub. info.: AIAA meeting papers on disc.  2004.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.: 42nd
44.

Conference Proceedings
Conference Proceedings
44. Description and performance of the preamplifier for the National Ignition Facility(NIF)laser system
Crane,J.K. ; Martinez,M.D. ; Moran,B. ; Laumann,C.W. ; Davin,J.M. ; Beach,R.J. ; Golick,B. ; Jones,R. ; Braucht,J. ; Perry,M.D. ; Skulina,K.M. ; Penko,F.A. ; Herman,S.M. ; Burkhart,S.C.
Pub. info.: Solid State Lasers for Application to Inertial Confinement Fusion: Second Annual International Conference.  Part2  pp.601-609,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3047
45.

Conference Proceedings
Conference Proceedings
45. Time-gated holographic imaging using photorefractive media
Tziraki,M. ; Jones,R. ; Barry,N.P. ; Hyde,S.C.W. ; French,P.M.W. ; Kwolek,K.M. ; Nolte,D.D. ; Melloch,M.R.
Pub. info.: Optical and Imaging Techniques for Biomonitoring III.  pp.118-128,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3196
46.

Conference Proceedings
Conference Proceedings
46. Superquenching of fluorescent polyelectrolytes and its applications for chemical and biological sensing
Bergstedt,T. ; Jones,R. ; Helgeson,R. ; McBranch,D.W. ; Whitten,D.G.
Pub. info.: Organic Photonic Materials and Devices III.  pp.94-100,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4279
47.

Conference Proceedings
Conference Proceedings
47. High-speed 3D imaging using photorefractive holography with novel low-coherence interferometers
Gu,Y. ; Ansari,Z. ; Siegel,J. ; Dunsby,C. ; Itoh,M. ; Parsons-Karavassilis,D. ; Tziraki,M. ; Jones,R. ; Dowling,K. ; French,P.M.W. ; Nolte,D.D. ; Headley,W.R. ; Melloch,M.R.
Pub. info.: Hybrid and Novel Imaging and New Optical Instrumentation for Biomedical Applications.  pp.28-36,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4434
48.

Conference Proceedings
Conference Proceedings
48. Metrology and analysis of two-dimensional SEM patterns
Mack,C.A. ; Jug,S. ; Jones,R. ; Apte,P. ; Williams,S. ; Pochkowski,M.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XV.  pp.377-384,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4344
49.

Conference Proceedings
Conference Proceedings
49. Elimination of monitor wafers in metal film process control
Johnson,W.H. ; Hobbs,D. ; Jones,R. ; Pors,G.
Pub. info.: Process, Equipment, and Materials Control in Integrated Circuit Manufacturing.  pp.52-55,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2637